February 16
X-ray diffraction, or XRD, is a long-standing and highly versatile technique for studying crystalline materials. It relies on analyzing how X-rays diffract as they pass through a sample, enabling a detailed evaluation of its structure. XRD can determine fundamental crystal parameters such as lattice constants, lattice geometry, phase identification of unknown materials, crystal size, single-crystal orientation, internal stress, strain, lattice defects, and more.
Its broad usefulness stems from the simplicity of the underlying physics. The diffraction pattern—specifically the angles of maximum intensity, the intensity at each angle, and the width of each peak—captures a wealth of structural information. Another advantage is that XRD requires no vacuum environment, which reduces equipment cost and gives it an edge over electron-based techniques. The method is non-contact, non-destructive, and requires minimal sample preparation.
